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WELCOME TO NCAFM 2023

The 24th International Conference on Non-contact Atomic Force Microscopy is part of the series of international conferences devoted to the latest progress in dynamical atomic force microscopy.

The conference covers the experimental, theoretical and instrumental developments in frequency modulation and other dynamic operation modes with particular emphasis on aspects of high-resolution imaging and force spectroscopy.

SCOPES

The Conference welcomes the contribution for oral and poster presentations on the following topics (but not limited to):

  • Novel instrumentation and techniques
  • Atomic resolution imaging on insulating substrates, semiconductors, and metals
  • High-resolution imaging of molecules, clusters and biological systems
  • Atomic-scale imaging and spectroscopic measurements of 2D materials & quantum materials
  • Simultaneous force and tunneling spectroscopy
  • Theoretical analysis of contrast mechanisms; forces & tunneling phenomena
  • Nanoscale measurements of charges, work function, and magnetic properties
  • Imaging and spectroscopy in liquid and ambient environments
  • Lateral force and friction, damping and energy dissipation
  • Machine learning and big data
  • Theory and simulations

IMPORTANT DATES

Call For Paper 1 January 2023
Deadline For Abstract Submission 15 April 2023
Acceptance Notification 1 May 2023
Author’s Registration Deadline 31 July 2023

VISIT SINGAPORE

TRAVEL GUIDE AND INFORMATION